| 摘要 |
<p>The drive capacity of a semiconductor integrated circuit is adjusted without relying on the inspection during mass production shipping. A semiconductor integrated circuit (21) includes an output buffer and an input buffer, and comprises a plurality of I/O cells (37,38,39,40,41) which exchange data with external devices, a test mode setting circuit (34) which connects the plurality of I/O cells in the chain state through logic elements during the test mode, and a delay measurement circuit (27) which measures the total delay of the plurality of I/O cells connected in a chain during the test mode.</p> |
