发明名称 |
SYSTEM FOR ANALYZING PLASMA DENSITY |
摘要 |
PURPOSE: A plasma density analysis system is provided to analyze density distribution of plasma of which a refractive index is changed in a medium by using a width shear interference pattern. CONSTITUTION: A light source(100) irradiates a laser beam. A beam amplifier(200) successively amplifies the laser beam. A light path guide reflects the laser beam having plasma density information. A plasma density distribution analyzer(500) obtains interference information of the reflected laser beam and beam intensity information of the transmitted laser beam.
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申请公布号 |
KR20090132421(A) |
申请公布日期 |
2009.12.30 |
申请号 |
KR20080058663 |
申请日期 |
2008.06.20 |
申请人 |
KOREA BASIC SCIENCE INSTITUTE |
发明人 |
NAM, YONG UN;LEE, JONG HA |
分类号 |
G01N21/01;G01N21/00 |
主分类号 |
G01N21/01 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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