CONTAINER FOR ELECTRONIC COMPONENT INSPECTION

摘要

Into socket holes arranged in either of an upper container and a lower container which make an airtight container when made to abut to each other, conductive sockets are fit by ensuring insulation. Into a bottomed non-through hole arranged in each conductive socket for attaching a probe, the probe is fitted replaceably. The conductive socket further has a data fetching line extending to the outside of the container from the bottom side of the hole. Therefore, when the upper container and the lower container are superposed to each other, the probe is brought into contact with the inspection terminal of the electronic component housed in the airtight container. Therefore, the container for electronic component inspection improves precision and simplicity in the inspection work of the electronic component.