发明名称 Electronic device test set and contact used therein
摘要 A contact for use in a test set which can be mounted to a load board of a tester apparatus. The contact, which serves to electrically connect at least one lead of a device being tested with a corresponding metallic trace on the load board, has a first end defining multiple contact points. As the contact is rotated about an axis generally perpendicular to a plane defined by the contact, successive contact points are sequentially engaged by a lead of the device being tested.
申请公布号 US7639026(B2) 申请公布日期 2009.12.29
申请号 US20070677870 申请日期 2007.02.22
申请人 JOHNSTECH INTERNATIONAL CORPORATION 发明人 SHELL DENNIS B.;GILK MATHEW L.;LOPEZ JOSE E.
分类号 G01R31/02;H01R11/18 主分类号 G01R31/02
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