发明名称 MEASURING APPARATUS AND METHOD
摘要 A measuring fixture includes at least one carrier unit for accommodating at least one work- piece to be measured. The carrier unit includes a carrying cell and a datum plane. The carrying cell is adapted for carrying the work-piece and has a carrying surface adapted for contacting a bottom surface of the work-piece. The datum plane is outward extended from the carrying cell, the datum plane and a top surface of the work-piece orient in the same direction, there is a predetermined height difference between the datum plane and the carrying surface, and there is a measurable height difference formed between the top surface of the work-piece and the datum plane, whereby the thickness of the work-piece is calculated to the summation of the predetermined height difference and the measurable height difference.
申请公布号 SG157270(A1) 申请公布日期 2009.12.29
申请号 SG20080059594 申请日期 2008.08.12
申请人 ORIENT SEMICONDUCTOR ELECTRONICS, LIMITED 发明人 LEU JIAN DE;CHANG CHIA CHI;CHENG I CHI;LIU KUN HUA;SU CHEN PING
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