<p>A system for on-the-fly inspection of components is provided. The system includes a prism structure disposed below an inspection item transit path. An image data system is disposed below the prism structure. A lighting assembly provides a first lighting source to illuminate a plurality of sides of an inspection item and a second lighting source to illuminate a bottom of the inspection item.</p>
申请公布号
SG157291(A1)
申请公布日期
2009.12.29
申请号
SG20090030461
申请日期
2009.05.05
申请人
SEMICONDUCTOR TECHNOLOGIES & INSTRUMENTS PTE LTD
发明人
AJHARALI AMANULLAH;GE, HAN CHENG;TAN, HUEK CHOY;LAI, HING TIM