发明名称 MULTIPLE SURFACE INSPECTION SYSTEM AND METHOD
摘要 <p>A system for on-the-fly inspection of components is provided. The system includes a prism structure disposed below an inspection item transit path. An image data system is disposed below the prism structure. A lighting assembly provides a first lighting source to illuminate a plurality of sides of an inspection item and a second lighting source to illuminate a bottom of the inspection item.</p>
申请公布号 SG157291(A1) 申请公布日期 2009.12.29
申请号 SG20090030461 申请日期 2009.05.05
申请人 SEMICONDUCTOR TECHNOLOGIES & INSTRUMENTS PTE LTD 发明人 AJHARALI AMANULLAH;GE, HAN CHENG;TAN, HUEK CHOY;LAI, HING TIM
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