| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a circuit group, its test method and a test device. Ž<P>SOLUTION: The test method includes: a step of regulating a first voltage of a first circuit into a second voltage neared to a reference voltage rather than the first voltage based on a first regulation signal; a step of regulating a third voltage of a second circuit into a fourth voltage neared to the reference voltage rather than the third voltage based on a second regulation signal; and a step of regulating margin ranges of the second voltage and the fourth voltage together based on a margin regulation signal. Thereby, test times of the first circuit and the second circuit are shortened to save a cost. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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