| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an inspection method and an inspection attachment device which make conduction between a tester and an electronic board good, even if a probe is slanted. Ž<P>SOLUTION: When the electronic board 501 is inspected through taking conduction by the probe 5005 between an inspection measuring conduction part of a tester 500 in which the inspection measuring conduction part of the electronic board 501, such as a printed wiring board, is arranged with a shape of a grid and the electronic board 501 to be inspected, an attachment device 1 having a spring part 102 which is contact with an end part of the probe 5005 and a contact pin part 101 which is contact with the electronic board 501 is made to intervene between the probe 5005 and the electronic board 501. Thereby, the inspection of the electronic board 501 is performed by enhancing the conduction between the tester 500 and the electronic board 501 through the attachment device 1 even if the probe 5005 is slanted. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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