| 摘要 |
A method for calibrating a high frequency measurement device having N measurement ports, where N is an integer >=1, in particular a vector network analyzer, for determining scattering parameters of a measurement object with an n-port measurement, where n is an integer >=1, wherein a high frequency test signal is fed into a first electrical lead connected to the measurement object or to a circuit having the measurement object, wherein for each port, an HF signal running on a second electrical lead, connected to the measurement object is coupled out from the second electrical lead at a first coupling position and at a second coupling position placed at a distance from the first coupling position, wherein from the two HF signals coupled out, in each port, for each measuring site or coupling site, an amplitude and/or a phase, relative to the HF test signal, of an HF signal running on the second electrical lead to the measurement object and of an HF signal running on the second electrical lead away from the measurement object are determined and therefrom, scattering parameters of the measurement object are calculated.
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