发明名称 SEMICONDUCTOR DEVICE TESTABLE ON QUALITY OF MULTIPLE MEMORY CELLS IN PARALLEL AND TESTING METHOD OF THE SAME
摘要 A semiconductor device includes: first and second input/output terminals; a first input/output line connected to the first input/output terminal; a second input/output line connected to the second input/output terminal; and a first by-path route that connects the first input/output line and the second input/output line. When in normal operation mode, the first by-path route is set in a non-conductive state. When in a test mode, the first by-path route is set into a conductive state so that a first data inputted to the first input/output terminal is outputted as a first data to the second input/output line, in correspondence with a transition of a clock signal in the first direction, and so that a second data inputted to said first input/output terminal is outputted as a second input data for said first input/output line, in correspondence with a transition of said clock signal in the second direction.
申请公布号 US2009316495(A1) 申请公布日期 2009.12.24
申请号 US20090488920 申请日期 2009.06.22
申请人 ELPIDA MEMORY, INC. 发明人 INABA HIDEO;ONODERA TADASHI
分类号 G11C7/10;G11C8/18;G11C29/00 主分类号 G11C7/10
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