发明名称 TESTING CONNECTOR OF ELECTRONIC COMPONENT
摘要 <P>PROBLEM TO BE SOLVED: To provide a testing connector for being surely connected to a flexible thin plate electrode extending from electronic components in parallel in one action. Ž<P>SOLUTION: An upper stage sandwiching plate 10 is a plastic slender plate, and right and left contact terminals 12 are mounted on the lower face by providing spacing. A lower stage sandwiching plate 11 is made of a slender printed circuit board, and a metal foil part 13 formed on the upper plate forms the right and left contact terminals. On the upper stage sandwiching plate 10, supports 17 extend from near of both the ends downward, the supports penetrate the lower stage sandwiching plate 11, and are fixed on a plastic slender base 19. Meanwhile, three upper stage supports 17 extend upward by penetrating the upper stage sandwiching plate 10 from the lower stage sandwiching plate 11, and a slender pressing member 20 is supported on the upper stage supports. A coil spring 21 is provided to be contracted along the supports between the pressing member and the upper stage sandwiching plate. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2009300193(A) 申请公布日期 2009.12.24
申请号 JP20080153641 申请日期 2008.06.12
申请人 ASUKA DENSHI KK 发明人 KURONUMA KATSUO
分类号 G01R1/073;G01R31/00;H01G13/00 主分类号 G01R1/073
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