发明名称 SEMICONDUCTOR MANUFACTURING APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor manufacturing apparatus wherein even an operator unfamiliar with communication specification for host computers can conduct a communication test to monitor transmission/reception messages in real time and easily specify the cause of an error when the error occurs. Ž<P>SOLUTION: When an message analysis means 3a acquires main data and a data division from a transmission/reception message and detects an error message, a name solution means 3e derives a message name and an event name from the main data and the data division. Furthermore, a data format analysis means 3f compares the data division with a predetermined data format, and a display means 3c focally displays the error data and indicates contents of the error. Then, a condition setting means 3b sets a condition for temporarily stopping message display, and a condition for message display or non-display. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2009302170(A) 申请公布日期 2009.12.24
申请号 JP20080152502 申请日期 2008.06.11
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 KOTANI HIROSHI
分类号 H01L21/02 主分类号 H01L21/02
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