| 发明名称 |
METHOD AND SYSTEM FOR PERFORMING STATISTICAL LEAKAGE CHARACTERIZATION, ANALYSIS, AND MODELING |
| 摘要 |
A method, system, and computer program product are disclosed for performing statistical leakage power characterization to estimate yield of a circuit in terms of leakage power. According to some approaches, this is performed with consideration of state correlation.
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| 申请公布号 |
US2009319969(A1) |
申请公布日期 |
2009.12.24 |
| 申请号 |
US20080143547 |
申请日期 |
2008.06.20 |
| 申请人 |
ZHANG LIZHENG;KHURANA PARVEEN;GEROUSIS VASSILIOS;CHANG HONGLIANG;SHRIVASTAVA SACHIN |
发明人 |
ZHANG LIZHENG;KHURANA PARVEEN;GEROUSIS VASSILIOS;CHANG HONGLIANG;SHRIVASTAVA SACHIN |
| 分类号 |
G06F17/50 |
主分类号 |
G06F17/50 |
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