METHOD FOR THE ANALYSIS OF ECHELLE SPECTRA

摘要

The echelle spectrometer (10) has a setting device for setting the positions of the optical components of the spectrometer, for position adjustment of the spectral lines within the output plane (72), containing a surface detector with a 2-dimensional array of image elements, e.g. a CCD detector, for wavelength calibration of the echelle spectra. The setting device can be computer controlled and includes at least one piezoelement supplied with a regulated setting voltage. Also included are Independent claims for the following: (a) a compensation method for shifts in the echelle spectrum in an echelle spectrometer; (b) a method for determining the binning-regions of a surface detector for an echelle spectrometer; (c) a wavelength calibration method for echelle spectra; (d) a method for background detection and wideband background correction