发明名称 |
Bipolar transistor and process for fabricating same. |
摘要 |
<p>Disclosed is a self-aligned process for providing an improved bipolar transistor structure.</p><p>The process includes the chemically etching of an intermediate insulating layer (10) to undercut another top layer (11) of a different insulating material in a self-aligned emitter process wherein the spacing of the emitter contact to the polysilicon base contact is reduced to a magnitude of approximately 0.2 to 0.3 micrometers. In addition, in the process an emitter plug (14) is formed to block the emitter region (12) from the heavy P+ ion dose implant of the extrinsic base (19).</p> |
申请公布号 |
EP0035126(A2) |
申请公布日期 |
1981.09.09 |
申请号 |
EP19810100812 |
申请日期 |
1981.02.05 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
HORNG, CHENG TZONG;SCHWENKER, ROBERT OTTO;TSANG, PAUL JA-MIN |
分类号 |
H01L29/73;H01L21/033;H01L21/331;H01L21/60;H01L21/762;H01L29/08;H01L29/732;(IPC1-7):01L21/76;01L29/72;01L29/08;01L21/00;01L21/60 |
主分类号 |
H01L29/73 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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