DATA RECEIVING CIRCUIT, TESTER USING SAME, AND TIMING ADJUSTING CIRCUIT FOR STROBE SIGNAL AND METHOD

摘要

A variable delay circuit 42 provides an adjustable delay to a strobe signal S5. An input latch circuit 14 latches each bit data included in internal serial data S2 by a strobe signal S6 delayed by the variable delay circuit 42. A delay set unit 40 adjusts a delay amount Ä1 provided to the strobe signal S5 by the variable delay circuit 42. While a calibration operation is being executed in which a known calibration pattern is inputted as serial data, the delay set unit 40 statistically acquires output latch data S3 of the input latch circuit 14, and adjusts the delay amount Ä1 such that probabilities of occurrence of 1 and 0 becomes a predetermined ratio.