发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND ITS INSPECTING METHOD
摘要 PURPOSE:To test the quantity for decision by inhibiting the contents of a program ROM from being read out to the external, comparing internally an externally inputted expected value with the contents of an internally read program, and reinforcing the secrecy protection of the program. CONSTITUTION:A specific instruction is inputted to indicate the execution of a program for inspection, and a program instruction is received from the outside and set in an accumulator A. Then, program instructions are read out of a program for information processing, and an arithmetic logical unit ALU make a coincidence/dissidence decision between the expected value inputted in the accumulator and a bit pattern. When the both are not coincident, information on the dissidence is stored in a specific address of an RAM and the inspection program is ended. When the both are coincident, it is decided in the next step whether the instruction is a final instruction END or not, and when so, information on that is written in the specific address of the RAM and the inspection program is ended. When not do, returns to the beginning.
申请公布号 JPS59231654(A) 申请公布日期 1984.12.26
申请号 JP19830105823 申请日期 1983.06.15
申请人 HITACHI SEISAKUSHO KK 发明人 TSUSHIMA KAZUMI
分类号 G06F11/22;G06F21/00;G11C29/00;G11C29/02;H01L21/822;H01L27/04;H01L27/10 主分类号 G06F11/22
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