发明名称 Magnetic tunnel junction device with improved barrier layer
摘要 Methods and apparatus are provided for magnetic tunnel junction (MTJ) devices and arrays, comprising metal-insulator-metal (M-I-M) structures with opposed first and second ferro-magnetic electrodes with alterable relative magnetization direction. The insulator is formed by depositing an oxidizable material (e.g., Al) on the first electrode, naturally oxidizing it, e.g., at about 0.03 to 10 milli-Torr for up to a few thousand seconds at temperatures below about 35° C., then further rapidly (e.g., plasma) oxidizing at a rate much larger than that of the initial natural oxidation. The second electrode of the M-I-M structure is formed on this oxide. More uniform tunneling properties result. A second oxidizable material layer is optionally provided after the initial natural oxidation and before the rapid oxidation step during which it is substantially entirely converted to insulating oxide. A second natural oxidation cycle may be optionally provided before the second layer is rapidly oxidized.
申请公布号 US7635654(B2) 申请公布日期 2009.12.22
申请号 US20060341986 申请日期 2006.01.27
申请人 EVERSPIN TECHNOLOGIES, INC. 发明人 SUN JIJUN;MARTIN JOHN T.;SLAUGHTER JON M.
分类号 H01L21/316;H01L27/115 主分类号 H01L21/316
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