发明名称 Power source noise measuring device, integrated circuit, and semiconductor device
摘要 To accurately measure power source noise generated inside an integrated circuit, the power source noise measuring device comprises: a mutual inductor pair placed inside an integrated circuit, the mutual inductor pair including (i) a first inductor connected to between power source voltages of the integrated circuit and (ii) a second inductor arranged opposite the first inductor, the both ends of which second inductor are connected to external output terminals; and a power source noise measuring unit which measures power source noise of the integrated circuit on the basis of a voltage waveform output from the second inductor of said mutual inductor pair via the external output terminals.
申请公布号 US7635986(B2) 申请公布日期 2009.12.22
申请号 US20070737215 申请日期 2007.04.19
申请人 FUJITSU LIMITED 发明人 TAKEMOTO TAKAHITO;HARADA AKIHIKO;FURUYA KAZUHIRO
分类号 G01R31/02;G01R29/26 主分类号 G01R31/02
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