发明名称 Interferometry method and system including spectral decomposition
摘要 In general, in one aspect, the disclosure features a method that includes directing measurement light to reflect from a measurement surface and combining the reflected measurement light with reference light, where the measurement light and reference light are derived from a common source, and there is a non-zero optical path length difference between the measurement light and reference light that is greater than a coherence length of the measurement light. The method further includes spectrally dispersing the combined light onto a multi-element detector to detect a spatially-varying intensity pattern, determining spatial information about the measurement surface based on the spatially-varying intensity pattern, and outputting the spatial information.
申请公布号 US7636168(B2) 申请公布日期 2009.12.22
申请号 US20060546119 申请日期 2006.10.11
申请人 ZYGO CORPORATION 发明人 DE LEGA XAVIER COLONNA;DE GROOT PETER
分类号 G01B11/02 主分类号 G01B11/02
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