发明名称 |
Heater chip test circuit and methods for using the same |
摘要 |
Test circuits on heater chips for testing a heater circuit having a heater element and a first power device. The test circuit can include a second power device, a test device configured to hold the first power device off and the second power device on for a selected heater circuit when the test device receives a signal to activate the test circuit, and a common test output to transmit a signal indicative of a state of the selected heater circuit. Methods for using the same are also provided.
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申请公布号 |
US7635174(B2) |
申请公布日期 |
2009.12.22 |
申请号 |
US20050208682 |
申请日期 |
2005.08.22 |
申请人 |
LEXMARK INTERNATIONAL, INC. |
发明人 |
BERGSTEDT STEVEN W.;EDELEN JOHN G.;GRAF PAUL W.;KING DAVID G.;MILLER, JR. ROBERT E.;PARISH GEORGE K.;ROWE KRISTI M. |
分类号 |
B41J29/38 |
主分类号 |
B41J29/38 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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