发明名称 SEMICONDUCTOR DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To reduce an error of an on-resistance ratio between main and sense DMOSs to improve current detection accuracy. <P>SOLUTION: Since a part 5a of an gate insulation film 5 enters in a main-side source electrode film 4, a drain current path 7 is lengthened, and the wiring resistance value (Ra+Rb) of the main-side electrode film 4 in the drain current path 7 is increased. Accordingly, the wiring resistance value (Ra+Rb) can be adjusted by adjusting the length of the part 5a. Accordingly the wiring resistance value Ra of a main VDMOS 2 and the wiring resistance value (Rc+Rd) of a sense VDMOS 3 can be set equal to each other, whereby the error of the on-resistance ratio between the main and sense DMOSs can be reduced to improve current detection accuracy. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2009295845(A) 申请公布日期 2009.12.17
申请号 JP20080149056 申请日期 2008.06.06
申请人 DENSO CORP 发明人 TOMATSU YUTAKA
分类号 H01L21/8234;H01L21/822;H01L27/04;H01L27/06;H01L27/088;H01L29/739;H01L29/78 主分类号 H01L21/8234
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