| 摘要 |
<p>PURPOSE:To make possible the continuous measurement of a resistance value at a high speed with a simple operation by constituting a measuring instrument of a contact point formed by holding a pair of thin conductive sheets having elasticity so as to face each other apart at a slight space provided therebetween on supporting bases. CONSTITUTION:A pair of the thin conductive sheets 3a, 3b having elasticity are held to face each other apart at the slight space provided therebetween on the supporting bases 4a, 4b and the resistance value of a chip resistor 1 is measured by pressing the lower surfaces of the electrode parts 2a, 2b at both terminals of the chip resistor 1 attracted to a vacuum attraction nozzle to a pair of the sheets 3a, 3b. Since the sheets 3a, 3b have the elasticity, the sheets are deflected when pressed to the resistor 1. The time for measuring the resistance value is substantially assured by such deflection. The continuous measurement of the resistance value at the high speed is made possible by the simple operation.</p> |
