发明名称 ELECTROLYTIC CAPACITOR EXAMINATION METHOD AND ELECTROLYTIC CAPACITOR EXAMINATION APPARATUS
摘要 PROBLEM TO BE SOLVED: To perform an accurate examination by enabling a chuck defect to be detected. SOLUTION: A power source unit 13 is configured by connecting in series a resistor 13b and a DC power source 13c between an anode output terminal 13d and a cathode output terminal 13e. A DC voltage V from the DC power source 13c is applied between an anode terminal 3 and a cathode terminal 4 of an electrolytic capacitor 1 from the power source unit 13. A waveform A between a case 5 of the electrolytic capacitor 1 and the anode output terminal 13d is measured from the application start of the DC voltage V and a determination area B is compared with the waveform A. If the overall waveform A is included in the determination area B, a non-short-circuited state is discriminated with the anode terminal 3 and the case 5 not short-circuited. If the waveform A is not partially included in the determination area B, either a short-circuited state with the anode terminal 3 and the case 5 short-circuited or a non-connected state with the cathode output terminal 13e and the cathode terminal 4 not connected is discriminated or a non-connected state is discriminated with the anode output terminal 13d and the anode terminal 3 not connected. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2009295856(A) 申请公布日期 2009.12.17
申请号 JP20080149202 申请日期 2008.06.06
申请人 HIOKI EE CORP 发明人 TAKAHASHI TETSUYA;KUBOTA HIROSHI
分类号 H01G13/00;H01G9/00 主分类号 H01G13/00
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