| 摘要 |
PROBLEM TO BE SOLVED: To provide a structure capable of suppressing a change in impedance and hard to pick up external noise. SOLUTION: The conductors of a flexible flat cable (30) are used, and a second insulating film (3e) and shielding foil (41) are also provided on the rear surface of a contact part (33) to an object to be measured. This probe is suited for being brought into contact to an object to be measured having a microstrip line structure for example. The change in impedance can be suppressed and moreover the probe is made to hardly pick up external noise, at the contact part (33) to the object to be measured also. COPYRIGHT: (C)2010,JPO&INPIT
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