发明名称 X-RAY DETECTOR GAIN CALIBRATION DEPENDING ON THE FRACTION OF SCATTERED RADIATION
摘要 It is described a gain calibration for a two-dimensional X-ray detector (315), in which the gain coefficients for scattered radiation (307b) and direct radiation (307a) are measured or estimated separately. A weighed average may be applied on the appropriate scatter fraction. The scatter fraction depending gain calibration method produces less ring artifacts in X-ray images as compared to known gain calibration methods, which do not take into account the fraction of scattered radiation reaching the X-ray detector (315).
申请公布号 US2009310754(A1) 申请公布日期 2009.12.17
申请号 US20070374391 申请日期 2007.07.10
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V. 发明人 TIMMER JAN;VAN DE HAAR PETER GEORGE
分类号 G01D18/00 主分类号 G01D18/00
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