发明名称 |
X-RAY DETECTOR GAIN CALIBRATION DEPENDING ON THE FRACTION OF SCATTERED RADIATION |
摘要 |
It is described a gain calibration for a two-dimensional X-ray detector (315), in which the gain coefficients for scattered radiation (307b) and direct radiation (307a) are measured or estimated separately. A weighed average may be applied on the appropriate scatter fraction. The scatter fraction depending gain calibration method produces less ring artifacts in X-ray images as compared to known gain calibration methods, which do not take into account the fraction of scattered radiation reaching the X-ray detector (315).
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申请公布号 |
US2009310754(A1) |
申请公布日期 |
2009.12.17 |
申请号 |
US20070374391 |
申请日期 |
2007.07.10 |
申请人 |
KONINKLIJKE PHILIPS ELECTRONICS N.V. |
发明人 |
TIMMER JAN;VAN DE HAAR PETER GEORGE |
分类号 |
G01D18/00 |
主分类号 |
G01D18/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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