发明名称 IN SITU X-RAY ABSORPTION FINE STRUCTURE ANALYZER OF VERY SMALL AMOUNT OF SUBSTANCE IN SOLUTION AND METHOD FOR THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide an in-situ XAFS analyzer of a very small amount of a substance in a solution capable of analyzing the reaction process of a very small amount of the substance in the solution by in-situ analysis. Ž<P>SOLUTION: The in-situ XAFS analyzer is equipped with a stirrer 1 with a heater for uniformly stirring the solution 11 containing a very small amount of the substance and advancing the specific reaction in the solution 11, a measuring cell 3 having not only the inflow port and outflow port of the solution 11 but also the storage part 3A of the solution 11 between the inflow port and the outflow port to keep the uniformity of the solution 11 and having a light receiving window 3B for irradiating the solution 11 in the storage part 3A with incident X rays 12 radiated from an X-ray source, a 7 element SDD8 capable of detecting a very small amount of the substance in the solution 11 on the spot by detecting the fluorescent X rays 13 radiated from the solution 11 irradiated with X rays through the light receiving window 3B, the flow channels 4 and 5 for allowing the stirrer with the heater and the measuring cell 3 to communicate with each other, and a liquid sending pump 2 for circulating the solution 11 between the stirrer with the heater and the measuring cell 3 both of which are interposed on the way of the flow channels 4 and 5. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2009294002(A) 申请公布日期 2009.12.17
申请号 JP20080146239 申请日期 2008.06.03
申请人 CENTRAL RES INST OF ELECTRIC POWER IND 发明人 AKIYASU HIROYUKI;YAMAMOTO TORU;TOCHIHARA YOSHIHISA;NODA NAOKI;NOGUCHI SHINICHI
分类号 G01N23/223 主分类号 G01N23/223
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