发明名称 |
METHOD AND SYSTEM OF TESTING DEVICE SENSITIVITY |
摘要 |
Method and system that test device sensitivity according to whether the device passes or fails when subjected to a test signal. The device may be repeatedly subjected to test signal at varying operating parameters in order to assess pass-fail threshold at which the device transitions from operating properly/improperly to operating improperly/properly.
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申请公布号 |
US2009312972(A1) |
申请公布日期 |
2009.12.17 |
申请号 |
US20080140390 |
申请日期 |
2008.06.17 |
申请人 |
SUN MICROSYSTEMS, INC. |
发明人 |
MULLER STEPHEN A.;CAI XIAO-DING;DEL ALAMO AGUSTIN;FREI JAMES M. |
分类号 |
G06F19/00 |
主分类号 |
G06F19/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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