发明名称 METHOD AND SYSTEM OF TESTING DEVICE SENSITIVITY
摘要 Method and system that test device sensitivity according to whether the device passes or fails when subjected to a test signal. The device may be repeatedly subjected to test signal at varying operating parameters in order to assess pass-fail threshold at which the device transitions from operating properly/improperly to operating improperly/properly.
申请公布号 US2009312972(A1) 申请公布日期 2009.12.17
申请号 US20080140390 申请日期 2008.06.17
申请人 SUN MICROSYSTEMS, INC. 发明人 MULLER STEPHEN A.;CAI XIAO-DING;DEL ALAMO AGUSTIN;FREI JAMES M.
分类号 G06F19/00 主分类号 G06F19/00
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