发明名称 METHOD FOR GROWING NITRIDE SEMICONDUCTOR LAYER
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for growing a nitride semiconductor layer capable of obtaining a nitride semiconductor layer with good p-type characteristics. <P>SOLUTION: When Be is used as a p-type dopant, the p-type characteristics of a p-GaN layer 23 significantly depend on the dislocation density of the surface of a substrate 5 as compared with the case where Mg is used. Therefore, carrier compensation of Be by dislocation can be suppressed, and a p-GaN layer 23 with good p-type characteristics is obtained, by using a substrate 5 having a dislocation density of 5&times;10<SP>8</SP>cm<SP>-2</SP>or less. The growth direction and composition distribution of the p-GaN layer 23 can be controlled with good accuracy by using an MBE technique. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2009292668(A) 申请公布日期 2009.12.17
申请号 JP20080146170 申请日期 2008.06.03
申请人 SUMITOMO ELECTRIC IND LTD 发明人 MORI DAIKI
分类号 C30B29/38;C23C14/06;C30B23/08;H01L21/203;H01L33/32 主分类号 C30B29/38
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