发明名称 WAFER PROCESSING DEPOSITION SHIELDING COMPONENTS
摘要 Embodiments described herein generally relate to an apparatus and method for uniform sputter depositing of materials into the bottom and sidewalls of high aspect ratio features on a substrate. In one embodiment, a collimator for mechanical and electrical coupling with a shield member positioned between a sputtering target and a substrate support pedestal is provided. The collimator comprises a central region and a peripheral region, wherein the collimator has a plurality of apertures extending therethrough and where the apertures located in the central region have a higher aspect ratio than the apertures located in the peripheral region.
申请公布号 US2009308739(A1) 申请公布日期 2009.12.17
申请号 US20090482846 申请日期 2009.06.11
申请人 APPLIED MATERIALS, INC. 发明人 RIKER MARTIN LEE;EWERT MAURICE E.;SUBRAMANI ANANTHA K.
分类号 C23C14/34 主分类号 C23C14/34
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