| 摘要 |
<P>PROBLEM TO BE SOLVED: To correctly evaluate on-chip variation in characteristics of a MOSFET incorporated in an LSI. Ž<P>SOLUTION: In a method of evaluating on-chip variations in characteristics of a MOSFET, in an LSI that incorporates a logic circuit using the MOSFET and a substrate bias control circuit for applying a substrate bias to the MOSFET; the median value and the mean value of the off-current of the MOSFET are monitored; and the ratio between the mean value and the median value is obtained to evaluate on-chip variation inside characteristics of the MOSFET. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
|
