| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a measurement apparatus and a testing apparatus for measuring the delay time in a delay circuit, in a short time. Ž<P>SOLUTION: The measurement apparatus for measuring the delay time in the delay circuit includes: a loop connecting section for connecting an output of the delay circuit to an input of the delay circuit; a loop counting section for counting pulses circulated within a loop circuit, including the delay circuit and the loop connection section; and a reference clock count section for accumulating a plurality of reference clocks, and counting the number of the reference clocks, while the loop counting section counts the predetermined number of the pulses. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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