| 摘要 |
PROBLEM TO BE SOLVED: To perform further reliable high-speed data transfer by solving the problem of a parasitic capacitance of a horizontal signal line in a CMOS (Complementary Metal-Oxide Semiconductor) sensor employing a column ADC (Analog Digital Converter) method. SOLUTION: Six-input subselector 302A for six latches 257 are provided between a data storing part 256 and horizontal transfer drivers 308. The six latches 257 are connected to the one six-input subselector 302A. The one six-input subselector 302A is connected to one horizontal transfer driver 308. The one horizontal transfer driver 308 is connected to a horizontal signal line 18. The horizontal transfer driver 308 connected to the horizontal signal line 18 is reduced to 1/6 to reduce the parasitic capacitance of the horizontal signal line 18 resulting from the horizontal transfer driver 308. In the horizontal transfer driver 308, only one stage is required regardless of the configuration of the six-input subselector 302A, series resistance does not increase when the horizontal signal line 18 is driven, and high-speed data transfer can be performed more reliably. COPYRIGHT: (C)2010,JPO&INPIT
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