发明名称 SILICON EPITAXIAL WAFER AND METHOD FOR PRODUCTION THEREOF
摘要 <p>Disclosed is a wafer having a good haze level in spite of the fact that the inclination angle of face [110] in the wafer is small. Also disclosed is a method for producing a silicon epitaxial wafer, which comprises the steps of: growing an epitaxial layer on a silicon monocrystal substrate having face [110] as the main face, wherein the off-angle of face [110] is less than 1 degree; and polishing the surface of the epitaxial layer until the surface of the epitaxial layer has a haze level of 0.18 ppm or less (as measured on SP2 at a DWO mode).</p>
申请公布号 WO2009150896(A1) 申请公布日期 2009.12.17
申请号 WO2009JP57759 申请日期 2009.04.17
申请人 SUMCO CORPORATION;ISHIBASHI, MASAYUKI;NAKAHARA, SHINJI;IWASHITA, TETSURO 发明人 ISHIBASHI, MASAYUKI;NAKAHARA, SHINJI;IWASHITA, TETSURO
分类号 H01L21/205;C23C16/56;H01L21/304 主分类号 H01L21/205
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