发明名称 |
SILICON EPITAXIAL WAFER AND METHOD FOR PRODUCTION THEREOF |
摘要 |
<p>Disclosed is a wafer having a good haze level in spite of the fact that the inclination angle of face [110] in the wafer is small. Also disclosed is a method for producing a silicon epitaxial wafer, which comprises the steps of: growing an epitaxial layer on a silicon monocrystal substrate having face [110] as the main face, wherein the off-angle of face [110] is less than 1 degree; and polishing the surface of the epitaxial layer until the surface of the epitaxial layer has a haze level of 0.18 ppm or less (as measured on SP2 at a DWO mode).</p> |
申请公布号 |
WO2009150896(A1) |
申请公布日期 |
2009.12.17 |
申请号 |
WO2009JP57759 |
申请日期 |
2009.04.17 |
申请人 |
SUMCO CORPORATION;ISHIBASHI, MASAYUKI;NAKAHARA, SHINJI;IWASHITA, TETSURO |
发明人 |
ISHIBASHI, MASAYUKI;NAKAHARA, SHINJI;IWASHITA, TETSURO |
分类号 |
H01L21/205;C23C16/56;H01L21/304 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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