| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a light reflection measurement apparatus for accurately detecting a Rayleigh scattering light and a discrete reflection light generated in a to-be-measured object. Ž<P>SOLUTION: The light reflection measurement apparatus 13A includes a light source section 40A, a measuring section 60A, and a processing section 70. The light source section 40A selects one of a first monitoring light having a modulated optical frequency and a comb light wave coherence function, and a second pulse monitoring light, outputs it to an optical coupler 12, branches a portion of the first monitoring light, and outputs it to an optical modulator 51 as a reference light. The measuring section 60A obtains an OCDR measurement result based on the reflection light generated when the first monitoring light is propagated through the to-be-measured object and the reference light output from the light source section 40A, and obtains an OTDR measurement result based on the reflection light generated when the second monitoring light is propagated through the to-be-measured object. The processing section 70 combines and outputs the OCDR measurement result and the OTDR measurement result obtained by the measuring section 60A. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
|
