| 摘要 |
<P>PROBLEM TO BE SOLVED: To inspect efficiently an integrated circuit, and to reduce a time necessary for inspection. <P>SOLUTION: In this integrated circuit board 100, a plurality of integrated circuits which are inspection objects are connected in a star shape, and operation clock data for JTAG of each integrated circuit and inspection data for inspecting each integrated circuit are stored, and when an integrated circuit which is an inspection object is designated, the operation clock data for the JTAG and the inspection data for the designated integrated circuit are determined, and the determined inspection data are input into the designated integrated circuit by an operation clock for the JTAG corresponding to the determined operation clock data for the JTAG. The integrated circuit board 100 determines a fault of the integrated circuit based on the inspection data and output data output from the integrated circuit into which the inspection data are input, and stores a determination result in a storage device. <P>COPYRIGHT: (C)2010,JPO&INPIT |
