发明名称 |
SEMICONDUCTOR MEMORY DEVICE AND METHOD OF FABRICATING THE SAME |
摘要 |
PURPOSE: A semiconductor memory device and a method of fabricating the same are provided to improve over-etching in a chemical mechanical polishing process by forming a polishing stopping layer within a second active region of a peripheral circuit region. CONSTITUTION: In a device, a semiconductor substrate(10) includes a first active region of the memory cell and a second active region of a peripheral circuit region. A plurality of firsts and second element isolation films(21,22) are projected from the surface of the semiconductor substrate. The first active region and the second active region are defined with the first and second element isolation films. At least one polishing stopping layer(23) is formed within the second active region. The polishing stopping layer is projected from the surface of the semiconductor substrate. The second active region including the polishing stopping layer is space for a capacitor.
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申请公布号 |
KR20090129258(A) |
申请公布日期 |
2009.12.16 |
申请号 |
KR20080055432 |
申请日期 |
2008.06.12 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, HONG SOO;BAEK, SU IN;CHOI, SEUNG WOOK |
分类号 |
H01L21/8247 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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