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发明名称
VERFAHREN UND STRUKTUR ZUR ENTWICKLUNG EINES TESTPROGRAMMS FÜR INTEGRIERTE HALBLEITERSCHALTUNGEN
摘要
申请公布号
AT451624(T)
申请公布日期
2009.12.15
申请号
AT20050743229T
申请日期
2005.05.23
申请人
ADVANTEST CORPORATION
发明人
PRAMANICK, ANKAN;ELSTON, MARK;KRISHNASWAMY, RAMACHANDRAN;ADACHI, TOSHIAKI
分类号
G01R31/3183;G06F11/263
主分类号
G01R31/3183
代理机构
代理人
主权项
地址
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