发明名称 Method of measuring in situ differential emissivity and temperature
摘要 A method for measuring the differential emissivity between two sites on the surface of a body and the temperature of the two sites. The method includes a plurality of measurements of the infrared radiation arising from each of the two sites under a number of different conditions. Some of the measurements include irradiation by external infrared radiation at a known wavelength and intensity. The infrared radiation arising from each of the sites may include emitted radiation, reflected ambient radiation, and reflected external radiation. Additionally, the temperature determined using the method described can be used to calibrate infrared imaging devices used to inspect the entire body.
申请公布号 US7632012(B2) 申请公布日期 2009.12.15
申请号 US20050217884 申请日期 2005.09.01
申请人 SIEMENS ENERGY, INC. 发明人 TWERDOCHLIB MICHAEL
分类号 G01J5/02 主分类号 G01J5/02
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