发明名称 Passive test circuit used to determine a back EMF of a voice coil motor during application of a bias voltage
摘要 A hard disk drive with a voice coil motor coupled to a head. The head moves relative to a disk. The voice coil motor receives a biasing voltage and has a back emf voltage. A test circuit is coupled to the voice coil motor to determine the back emf voltage. The back emf voltage can be used to analyze low frequency vibration in the disk drive. The test circuit can be constructed so that the back emf voltage is proportional to a pair of test resistors and/or a pair of test inductors. The biasing voltage allows the back emf voltage to be measured and analyzed while the head is at any location from the ID to the OD of the disk.
申请公布号 US7633707(B2) 申请公布日期 2009.12.15
申请号 US20080012858 申请日期 2008.02.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LIU YANNING;KANG SEONG WOO;CHANG SEUNGMAN
分类号 G11B5/596 主分类号 G11B5/596
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