| 摘要 |
PURPOSE: An LED chip test apparatus and a test method using the same are provided to measure performance of an LED chip accurately by increasing the intensity of incident light on a measurement unit. CONSTITUTION: Plural platform members(2) comprise supporting members supporting an LED chip. A rotating member(3) successively locates the platform members at the test position of the LED chip. A rotation unit(4) is combined to the rotating member. The rotation unit rotates the rotating member in order to successively locate the platform members at the test position. A test unit(5) comprises a contact unit enabling the LED chip to emit light, a first movement unit moving the contact unit, and a measurement unit measuring photonic characteristics of the LED chip. A transfer member is used in order to transfer light of the LED chip to the measurement unit. The contact unit passes through a groove of the transfer member. |
