| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor device reducing the cost on the host side, such as a circuit tester, and simplifying the configuration on the host side. Ž<P>SOLUTION: A random number pattern generator 21 generates a scan-in signal and outputs it to a scanning timer 0 (22-1), and a scanning timer 1 (22-2) having the same function as the scanning timer 0 (22-1). A comparator 23 compares the scan-out signal output from the scanning timer 0 (22-1) with the scan-out signal output from the scanning timer 1 (22-2) and outputs the comparison result to a test I/F 30. Therefore, while a storage part for storing an expected value and a scan-out value is unnecessary and the cost on the host side can be reduced, the configuration on the host side can be simplified. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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