| 摘要 |
Described herein is a method for measuring, via a microwave sensor, the thickness of a layer of first material, said method envisaging: acquiring at least one frequency response of the layer of first material via a microwave sensor; setting the microwave sensor on a plurality of specimens of second materials for different temperature values in such a way as to obtain reference data; calibrating the microwave sensor as a function of the electrical conductivity of the first material using the reference data; measuring the temperature of the layer of first material via a temperature sensor; determining measurement parameters from the frequency response; and processing the reference data with the measurement parameters to obtain a measurement of the thickness of the layer of first material.
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