| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor memory device capable of performing testing at an actually operating speed of the semiconductor memory device, and capable of reducing the number of input/output terminals of a tester required for connection. SOLUTION: A loopback circuit 14 is provided which, when test data is stored into a memory unit 12, data inputted through a portion of data input/output terminals 17 is output and stored into the memory unit 12, and when an operation test for the memory unit 12 is performed, data read out from the memory unit 12 is once latched and is input and stored into the memory unit 12, and when the test data is read out from the memory unit 12, the test data is successively output from a portion of the data input/output terminals 17. COPYRIGHT: (C)2010,JPO&INPIT |
