| 摘要 |
A test fixture (120) is disclosed for electrically testing a device under test (130) by forming a plurality of temporary mechanical and electrical connections between terminals (131) on the device under test (130) and contact pads (161) on the load board (160). The test fixture (120) has a replaceable membrane (150) that includes vias (151), with each via (151) being associated with a terminal (131) on the device under test (130) and a contact pad (161) on the load board (160). In some cases, each via (151) has an electrically conducting wall for conducting current between the terminal (131) and the contact pad (161). In some cases, each via (151) includes a spring (152) that provides a mechanical resisting force to the terminal (131) when the device under test (130) is engaged with the test fixture (120). In some cases, the spring (201) is housed within a pair of nested, open-ended tubes (202, 203) that can slide longitudinally with respect to each other. In some cases, the contact pad (301, 342) that contacts the terminal (131) has a textured surface and/or is tilted away from parallel to the load board when the device under test is engaged.
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