ELECTRONIC APPARATUS TESTING DEVICE AND ELECTRONIC APPARATUS TESTING METHOD
摘要
<p>Provided is an electronic apparatus testing device capable of precisely and consecutively testing the operation of many electronic apparatuses such as cellular phones. The electronic apparatus testing device (1) has a test box (10) for testing the electronic apparatuses (P), waveguides (20A, 20B) which communicate the outside and inside of the test box (10) with each other and have slide doors (23) for blocking radio waves from the outside by closing their opening parts at least when performing the test, and a belt conveyer (30) having a belt (31) for conveying the electronic apparatuses (P). The electronic apparatus testing device is characterized in that the belt (31) can pass through the insides of the waveguides (20A, 20B) to convey the electronic apparatuses (P) into the test box (10) and out of the same.</p>
申请公布号
WO2009147728(A1)
申请公布日期
2009.12.10
申请号
WO2008JP60218
申请日期
2008.06.03
申请人
NIPPON LIGHT METAL COMPANY, LTD.;SASADA, MASAAKI;NAGASHIMA, MICHIO;UCHIDA, KATSUYA;AOKI, KAZUO