发明名称 Methods of manufacturing oxide semiconductor thin film transistor
摘要 Provided is a method of manufacturing an oxide semiconductor thin film transistor using a transparent oxide semiconductor as a material for a channel. The method of manufacturing the oxide semiconductor thin film transistor includes forming a passivation layer on a channel layer and performing an annealing process for one hour or more at a temperature of about 100° C. or above.
申请公布号 US2009305468(A1) 申请公布日期 2009.12.10
申请号 US20090320627 申请日期 2009.01.30
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JUNG JISIM;PARK YOUNGSOO;LEE SANGYOON;KIM CHANGJUNG;KIM TAESANG;KWON JANGYEON;SON KYUNGSEOK
分类号 H01L21/336 主分类号 H01L21/336
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