发明名称 METHOD OF REDUCING MEMORY EFFECTS IN SEMICONDUCTOR EPITAXY
摘要 <p>A method of reducing memory effects during an epitaxial growth process is provided in which a gas mixture comprising hydrogen gas and a halogen- containing gas is used to flush the CVD reaction chamber between growth steps.</p>
申请公布号 WO2009148930(A1) 申请公布日期 2009.12.10
申请号 WO2009US45551 申请日期 2009.05.29
申请人 DOW CORNING CORPORATION;LOBODA, MARK 发明人 LOBODA, MARK
分类号 C23C16/44;H01L21/205 主分类号 C23C16/44
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