| 摘要 |
PURPOSE: An apparatus for inspecting electric condition and a method for manufacturing the same are provided to match impedance of signal lines by adjusting line width of a signal line or gap between the signal line and a ground. CONSTITUTION: An apparatus(100) for testing electric condition comprises a substrate structure(110), probes(141,142,143,144) and a channel terminal(101). The substrate structure connects DUTs(Device Under Test)(151,152,153,154) electrically connected to the probes and a tester(10) judging electric state of the DUTs. The substrate structure is a single substrate. The probes are located on one side(130a) of the substrate structure. The channel terminal is located on the other side(120a) of the substrate structure. The substrate structure comprises a first substrate(120) and a second substrate(130). The channel terminal electrically contacts the test during electric condition investigation process. |
