发明名称 |
METHOD FOR ENHANCING POSITIVE (CLEAR FIELD) PHASE SHIFT MASK (TRANSPARENT PHASE SHIFT MASK WITH OPAQUE APERTURE) WITH BORDER REGIONS AROUND PHASE 0 REGION AND PHASE 180 REGIONS |
摘要 |
<P>PROBLEM TO BE SOLVED: To generate phase shifting patterns to improve patterning of gates and other layers, structures or regions needing sub-nominal dimensions. <P>SOLUTION: A technique is disclosed, in which a first boundary region is added to the ends of a phase zero (0) pattern defining polygons and a second boundary region is added to the ends of a phase 180 pattern. This technique can improve the line-end pattern definition and improve the manufacturability and a patterning process window. The added boundary region balances the light on both sides of the line ends, resulting in a more predictable final resist pattern. <P>COPYRIGHT: (C)2010,JPO&INPIT |
申请公布号 |
JP2009288818(A) |
申请公布日期 |
2009.12.10 |
申请号 |
JP20090211488 |
申请日期 |
2009.09.14 |
申请人 |
ADVANCED MICRO DEVICES INC |
发明人 |
LUKANC TODD P;SPENCE CHRISTOPHER A |
分类号 |
G03F1/34;G03F1/00;G03F1/26;G03F1/30;G03F1/36 |
主分类号 |
G03F1/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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