发明名称 METHOD FOR ENHANCING POSITIVE (CLEAR FIELD) PHASE SHIFT MASK (TRANSPARENT PHASE SHIFT MASK WITH OPAQUE APERTURE) WITH BORDER REGIONS AROUND PHASE 0 REGION AND PHASE 180 REGIONS
摘要 <P>PROBLEM TO BE SOLVED: To generate phase shifting patterns to improve patterning of gates and other layers, structures or regions needing sub-nominal dimensions. <P>SOLUTION: A technique is disclosed, in which a first boundary region is added to the ends of a phase zero (0) pattern defining polygons and a second boundary region is added to the ends of a phase 180 pattern. This technique can improve the line-end pattern definition and improve the manufacturability and a patterning process window. The added boundary region balances the light on both sides of the line ends, resulting in a more predictable final resist pattern. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2009288818(A) 申请公布日期 2009.12.10
申请号 JP20090211488 申请日期 2009.09.14
申请人 ADVANCED MICRO DEVICES INC 发明人 LUKANC TODD P;SPENCE CHRISTOPHER A
分类号 G03F1/34;G03F1/00;G03F1/26;G03F1/30;G03F1/36 主分类号 G03F1/34
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